具体内容如下，先谢谢了！！！ Title: Effect of film thickness and grain size on fatigue-induced dislocation structures in Cu thin films Authors: G. P. Zhang, R. Schwaiger, C. A. Volkert, O. Kraft Serial title: Philosophical Magazine Letters Publisher: Taylor & Francis Issue: Volume 83, Number 8 / August 2003 Pages: 477 - 483 URL: Linking Options link::
http://taylorandfrancis.metapress.com/(qchtove4zrnkz4mku5m1wvjb)/app/home/contribution.asp?referrer=parent&backto=issue,2,7;journal,38,129;linkingpublicationresults,1:100680,1 email:victorkongksl@yahoo.com.cn
